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Information card for entry 1552092
Preview
| Coordinates | 1552092.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | ZSM-25 |
|---|---|
| Chemical name | Si-MWF |
| Formula | O2880 Si1440 |
| Calculated formula | O2880 Si1440 |
| Title of publication | Automated serial rotation electron diffraction combined with cluster analysis: an efficient multi-crystal workflow for structure determination |
| Authors of publication | Wang, Bin; Zou, Xiaodong; Smeets, Stef |
| Journal of publication | IUCrJ |
| Year of publication | 2019 |
| Journal volume | 6 |
| Journal issue | 5 |
| a | 45.07 Å |
| b | 45.07 Å |
| c | 45.07 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 91550.9 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 2 |
| Space group number | 229 |
| Hermann-Mauguin space group symbol | I m -3 m |
| Hall space group symbol | -I 4 2 3 |
| Residual factor for all reflections | 0.5268 |
| Residual factor for significantly intense reflections | 0.4863 |
| Weighted residual factors for significantly intense reflections | 0.8264 |
| Weighted residual factors for all reflections included in the refinement | 0.8448 |
| Goodness-of-fit parameter for all reflections included in the refinement | 3.065 |
| Diffraction radiation wavelength | 0.0251 Å |
| Diffraction radiation type | electron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 216970 (current) | 2019-07-12 | cif/ Adding structures of 1552087, 1552088, 1552089, 1552090, 1552091, 1552092, 1552093 via cif-deposit CGI script. |
1552092.cif |
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Users of the data should acknowledge the original authors of the
structural data.