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Information card for entry 1557104
Preview
| Coordinates | 1557104.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H20 N2 Ni O2 |
|---|---|
| Calculated formula | C20 N2 Ni O2 |
| SMILES | [Ni]123Oc4ccccc4C=[N]2[C@@H]2CCCC[C@H]2[N]3=Cc2ccccc2O1 |
| Title of publication | An Optically Active Nickel(II) Schiff Base Coordination Compound N,N'-(1R,2R)-(-)-1,2-Cyclohexylenebis(salicylideneiminato)nickel(II) |
| Authors of publication | Wojtczak, A.; Szlyk, E.; Jaskolski, M.; Larsen, E. |
| Journal of publication | Acta Chemica Scandinavica |
| Year of publication | 1997 |
| Journal volume | 51 |
| Pages of publication | 274 - 278 |
| a | 10.964 ± 0.002 Å |
| b | 12.735 ± 0.003 Å |
| c | 12.329 ± 0.002 Å |
| α | 90° |
| β | 95.26 ± 0.03° |
| γ | 90° |
| Cell volume | 1714.2 ± 0.6 Å3 |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 5 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0453 |
| Residual factor for significantly intense reflections | 0.0351 |
| Weighted residual factors for significantly intense reflections | 0.0357 |
| Weighted residual factors for all reflections included in the refinement | 0.0404 |
| Goodness-of-fit parameter for all reflections included in the refinement | 3.24 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 247088 (current) | 2020-01-22 | cif/ Adding structures of 1557104 via cif-deposit CGI script. |
1557104.cif |
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