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Information card for entry 1558169
Preview
| Coordinates | 1558169.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Bis(diethyldithiocarbamato)iodophenyltellurium(IV) [PhTe(Et2NCS2)2I] |
|---|---|
| Formula | C16 H25 I N2 S4 Te |
| Calculated formula | C16 I N2 S4 Te |
| SMILES | I[Te]12([S]=C(S1)N(CC)CC)(SC(=[S]2)N(CC)CC)c1ccccc1 |
| Title of publication | Synthesis and Crystal Structure of Bis(diethyldithiocarbamato)iodophenyltellurium(IV), [PhTe(Et2NCS2)2I] |
| Authors of publication | Husebye, Steinar; Maartmann-Moe, Knut |
| Journal of publication | Acta Chemica Scandinavica |
| Year of publication | 1995 |
| Journal volume | 49 |
| Pages of publication | 834 - 838 |
| a | 10.124 ± 0.003 Å |
| b | 13.762 ± 0.005 Å |
| c | 17.592 ± 0.006 Å |
| α | 83.61 ± 0.02° |
| β | 82.62 ± 0.02° |
| γ | 71.54 ± 0.03° |
| Cell volume | 2299.1 ± 1.4 Å3 |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for significantly intense reflections | 0.027 |
| Weighted residual factors for significantly intense reflections | 0.032 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.347 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 252568 (current) | 2020-06-03 | cif/ Adding structures of 1558169 via cif-deposit CGI script. |
1558169.cif |
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