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Information card for entry 1558502
Preview
| Coordinates | 1558502.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Tetrakis(mu-2-methyl-2-phenylpropionato-O,O') bis(triphenylphosphine)dinickel(II), [Ni(Me2PhCCOO)2PPh3]2 |
|---|---|
| Formula | C76 H74 Ni2 O8 P2 |
| Calculated formula | C76 Ni2 O8 P2 |
| Title of publication | Magnetic Properties of Some Nickel(II)-Substituted Propanoate Dimers and the Crystal Structure of Tetrakis(mu-2-methyl-2-phenylpropionato-O,O') bis(triphenylphosphine)dinickel(II), [Ni(Me2PhCCOO)2PPh3]2 |
| Authors of publication | Husebye, Steinar; Kato, Michinobu; Maartmann-Moe, Knut; Muto, Yoneichiro; Nakashima, Michio; Tokii, Tadashi |
| Journal of publication | Acta Chemica Scandinavica |
| Year of publication | 1994 |
| Journal volume | 48 |
| Pages of publication | 628 - 634 |
| a | 12.001 ± 0.005 Å |
| b | 14.688 ± 0.005 Å |
| c | 19.666 ± 0.006 Å |
| α | 86.13 ± 0.03° |
| β | 82.57 ± 0.03° |
| γ | 76.72 ± 0.03° |
| Cell volume | 3343 ± 2 Å3 |
| Ambient diffraction temperature | 295 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for significantly intense reflections | 0.085 |
| Weighted residual factors for significantly intense reflections | 0.083 |
| Goodness-of-fit parameter for all reflections included in the refinement | 2.408 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.7093 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 254017 (current) | 2020-07-06 | cif/ Adding structures of 1558502 via cif-deposit CGI script. |
1558502.cif |
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