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Information card for entry 1558629
Preview
| Coordinates | 1558629.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C54 H95 N O4 |
|---|---|
| Calculated formula | C54 H95 N O4 |
| Title of publication | The Crystal Engineering of Radiation-Sensitive Diacetylene Cocrystals and Salts |
| Authors of publication | Hall, Amy V.; Yufit, Dimitrii S.; Apperley, D. C.; Senak, Larry; Musa, Osama; Hood, David K.; Steed, Jonathan W. |
| Journal of publication | Chemical Science |
| Year of publication | 2020 |
| a | 9.5968 ± 0.0006 Å |
| b | 4.6441 ± 0.0003 Å |
| c | 57.52 ± 0.004 Å |
| α | 90° |
| β | 92.59 ± 0.002° |
| γ | 90° |
| Cell volume | 2561 ± 0.3 Å3 |
| Cell temperature | 120 K |
| Ambient diffraction temperature | 120 K |
| Number of distinct elements | 4 |
| Space group number | 13 |
| Hermann-Mauguin space group symbol | P 1 2/n 1 |
| Hall space group symbol | -P 2yac |
| Residual factor for all reflections | 0.0945 |
| Residual factor for significantly intense reflections | 0.0561 |
| Weighted residual factors for significantly intense reflections | 0.1217 |
| Weighted residual factors for all reflections included in the refinement | 0.1361 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.049 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 254418 (current) | 2020-07-21 | cif/ Adding structures of 1558626, 1558627, 1558628, 1558629, 1558630, 1558631, 1558632, 1558633 via cif-deposit CGI script. |
1558629.cif |
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Users of the data should acknowledge the original authors of the
structural data.