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Information card for entry 1558907
Preview
| Coordinates | 1558907.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | DUT-160 |
|---|---|
| Formula | C42 H20 Cu2 N2 O10 |
| Calculated formula | C42 H20 Cu2 N2 O10 |
| Title of publication | Engineering micromechanics of soft porous crystals for negative gas adsorption |
| Authors of publication | Krause, Simon; Evans, Jack D.; Bon, Volodymyr; Senkovska, Irene; Ehrling, Sebastian; Iacomic, Paul; Többens, Daniel M; Llewellyn, Philip L.; Wallacher, Dirk; Weiss, Manfred S.; Zheng, Bin; Yot, Pascal G.; Maurin, Guillaume; Coudert, François-Xavier; Kaskel, Stefan |
| Journal of publication | Chemical Science |
| Year of publication | 2020 |
| a | 50.11 ± 0.006 Å |
| b | 50.11 ± 0.006 Å |
| c | 50.11 ± 0.006 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 125827 ± 3 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 225 |
| Hermann-Mauguin space group symbol | F m -3 m |
| Hall space group symbol | -F 4 2 3 |
| Residual factor for all reflections | 0.0755 |
| Residual factor for significantly intense reflections | 0.0577 |
| Weighted residual factors for significantly intense reflections | 0.1921 |
| Weighted residual factors for all reflections included in the refinement | 0.2254 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.083 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.89499 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 255612 (current) | 2020-08-25 | cif/ Adding structures of 1558902, 1558903, 1558904, 1558905, 1558906, 1558907 via cif-deposit CGI script. |
1558907.cif |
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Users of the data should acknowledge the original authors of the
structural data.