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Information card for entry 1559002
Preview
| Coordinates | 1559002.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C26 H15 N3 O8 |
|---|---|
| Calculated formula | C26 H15 N3 O8 |
| Title of publication | Crystal Structure of Dinaphtho[2,1,1′,2′]furan Picrate |
| Authors of publication | HONDA, Risa; TANAKA, Atsuhiko; HIRABAYASHI, Kazunori; AKIYAMA, Kazuhiko; SHIMIZU, Toshio; SUGIURA, Ken-ichi |
| Journal of publication | X-ray Structure Analysis Online |
| Year of publication | 2019 |
| Journal volume | 35 |
| Journal issue | 0 |
| Pages of publication | 69 |
| a | 10.0912 ± 0.0018 Å |
| b | 7.5548 ± 0.0011 Å |
| c | 27.919 ± 0.005 Å |
| α | 90° |
| β | 94.047 ± 0.004° |
| γ | 90° |
| Cell volume | 2123.2 ± 0.6 Å3 |
| Cell temperature | 93 K |
| Ambient diffraction temperature | 93 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0954 |
| Residual factor for significantly intense reflections | 0.0502 |
| Weighted residual factors for significantly intense reflections | 0.1028 |
| Weighted residual factors for all reflections included in the refinement | 0.119 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.047 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 256207 (current) | 2020-09-07 | cif/ Adding structures of 1559002 via cif-deposit CGI script. |
1559002.cif |
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Users of the data should acknowledge the original authors of the
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