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Information card for entry 1559025
Preview
Coordinates | 1559025.cif |
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Original paper (by DOI) | HTML |
Common name | 1,4,5,8-tetramethyl-r-l-nitro-c-2-trinitromethyl-1,2-dihydronaphthalene |
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Formula | C15 H16 N4 O8 |
Calculated formula | C15 N4 O8 |
SMILES | O=N(=O)[C@]1([C@H](C=C(c2c(ccc(c12)C)C)C)C(N(=O)=O)(N(=O)=O)N(=O)=O)C.O=N(=O)[C@@]1([C@@H](C=C(c2c(ccc(c12)C)C)C)C(N(=O)=O)(N(=O)=O)N(=O)=O)C |
Title of publication | Photochemical Nitration by Tetranitromethane. XI. Isolation and X-Ray Structural Analysis of an Anomalous cis-1-Nitro/2-trinitromethyl Adduct from 1,4,5,8-Tetramethylnaphthalene |
Authors of publication | Eberson, Lennart; Calvert, Jane L.; Hartshorn, Michael P.; Robinson, Ward T. |
Journal of publication | Acta Chemica Scandinavica |
Year of publication | 1993 |
Journal volume | 47 |
Pages of publication | 1025 - 1034 |
a | 6.404 ± 0.0003 Å |
b | 9.553 ± 0.005 Å |
c | 14.08 ± 0.01 Å |
α | 83.74 ± 0.05° |
β | 86.12 ± 0.05° |
γ | 75.7 ± 0.04° |
Cell volume | 829 ± 0.8 Å3 |
Ambient diffraction temperature | 183 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for significantly intense reflections | 0.037 |
Weighted residual factors for significantly intense reflections | 0.085 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
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256251 (current) | 2020-09-09 | cif/ Adding structures of 1559025 via cif-deposit CGI script. |
1559025.cif |
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