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Information card for entry 1560999
Preview
| Coordinates | 1560999.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C56 H46 N8 Ni2 O8 Si |
|---|---|
| Calculated formula | C56 H46 N8 Ni2 O8 Si |
| Title of publication | Two Ni(II) semiconducting metal-organic frameworks based on the tetrakis(4-carboxyphenyl)silane and an imidazole ligand: Syntheses, characterization, water stability and photoelectric properties |
| Authors of publication | Li, Qi; Guo, Tiantian; Lv, Xin; Lin, Yifang; Dai, Zhihui; Fang, Min; Bao, Jianchun; Wu, Yong |
| Journal of publication | Journal of Solid State Chemistry |
| Year of publication | 2018 |
| Journal volume | 265 |
| Pages of publication | 100 - 108 |
| a | 16.693 ± 0.006 Å |
| b | 21.059 ± 0.007 Å |
| c | 89.25 ± 0.03 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 31375 ± 19 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296.15 K |
| Number of distinct elements | 6 |
| Space group number | 70 |
| Hermann-Mauguin space group symbol | F d d d :2 |
| Hall space group symbol | -F 2uv 2vw |
| Residual factor for all reflections | 0.1076 |
| Residual factor for significantly intense reflections | 0.0672 |
| Weighted residual factors for significantly intense reflections | 0.1406 |
| Weighted residual factors for all reflections included in the refinement | 0.1652 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.118 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 262972 (current) | 2021-03-10 | cif/ Adding structures of 1560999, 1561000 via cif-deposit CGI script. |
1560999.cif |
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Users of the data should acknowledge the original authors of the
structural data.