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Information card for entry 1561010
Preview
| Coordinates | 1561010.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Ba2 Cl2 O6 Se2 Zn |
|---|---|
| Calculated formula | Ba2 Cl2 O6 Se2 Zn |
| SMILES | [Ba+2].[Ba+2].[Ba+2].[Ba+2].[Zn](O[Se](=O)[O-])(Cl)(O[Se](=O)[O-])(Cl)(O[Se]1=O)O[Se](=O)O[Zn](O1)(Cl)Cl |
| Title of publication | Crystal structures and characterizations of two new selenite chlorides: 1D Ba2Zn(SeO3)2Cl2 and 2D BaZn2(SeO3)2Cl2 |
| Authors of publication | Li, Qiang; Geng, Lei; Lu, Hong-Yan; Dai, Kai; Cheng, Wen-Dan |
| Journal of publication | Journal of Solid State Chemistry |
| Year of publication | 2018 |
| Journal volume | 265 |
| Pages of publication | 117 - 122 |
| a | 6.7677 ± 0.0003 Å |
| b | 12.6321 ± 0.0004 Å |
| c | 5.3916 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 460.93 ± 0.03 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 58 |
| Hermann-Mauguin space group symbol | P n n m |
| Hall space group symbol | -P 2 2n |
| Residual factor for all reflections | 0.0092 |
| Residual factor for significantly intense reflections | 0.0088 |
| Weighted residual factors for significantly intense reflections | 0.0227 |
| Weighted residual factors for all reflections included in the refinement | 0.0228 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.013 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 263032 (current) | 2021-03-15 | cif/ Adding structures of 1561010, 1561011 via cif-deposit CGI script. |
1561010.cif |
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