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Information card for entry 1561964
Preview
| Coordinates | 1561964.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Eu2 Na8 S12 Si4 |
|---|---|
| Calculated formula | Eu2 Na8 S12 Si4 |
| Title of publication | Structural, optical, and magnetic properties of Na8Eu2(Si2S6)2 and Na8Eu2(Ge2S6)2: Europium(II) quaternary chalcogenides that contain an ethane-like (Si2S6)6− or (Ge2S6)6− moiety |
| Authors of publication | Choudhury, Amitava; Ghosh, Kartik; Grandjean, Fernande; Long, Gary J.; Dorhout, Peter K. |
| Journal of publication | Journal of Solid State Chemistry |
| Year of publication | 2015 |
| Journal volume | 226 |
| Pages of publication | 74 - 80 |
| a | 6.7784 ± 0.0014 Å |
| b | 11.68 ± 0.002 Å |
| c | 7.6622 ± 0.0016 Å |
| α | 90° |
| β | 107.271 ± 0.003° |
| γ | 90° |
| Cell volume | 579.3 ± 0.2 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 12 |
| Hermann-Mauguin space group symbol | C 1 2/m 1 |
| Hall space group symbol | -C 2y |
| Residual factor for all reflections | 0.0671 |
| Residual factor for significantly intense reflections | 0.0606 |
| Weighted residual factors for significantly intense reflections | 0.1375 |
| Weighted residual factors for all reflections included in the refinement | 0.14 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.392 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 264370 (current) | 2021-04-21 | cif/ Adding structures of 1561964, 1561965 via cif-deposit CGI script. |
1561964.cif |
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