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Information card for entry 1562695
Preview
Coordinates | 1562695.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C52 H32 Fe2 |
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Calculated formula | C52 H32 Fe2 |
SMILES | c1c2cc3ccc4cc(cc5ccc1c3c45)[c]13[cH]4[cH]5[cH]6[cH]1[Fe]17893456[c]3([cH]9[cH]8[cH]7[cH]13)c1cc3ccc4cc(cc5ccc(c1)c3c45)[c]13[cH]4[cH]5[cH]6[cH]1[Fe]17893456[c]32[cH]8[cH]7[cH]9[cH]13 |
Title of publication | Cyclophane with Eclipsed Pyrene Units Enables Construction of Spin Interfaces with Chemical Accuracy |
Authors of publication | Metzelaars, Marvin; Schneider, Claus M.; Rawson, Jeff; Bürgler, Daniel E.; Sanz, Sergio; Matthes, Frank; Kögerler, Paul; Hattori, Takuma; Schleicher, Sebastian; Borca, Bogdana |
Journal of publication | Chemical Science |
Year of publication | 2021 |
a | 10.6986 ± 0.0003 Å |
b | 10.1128 ± 0.0002 Å |
c | 15.0273 ± 0.0004 Å |
α | 90° |
β | 94.84 ± 0.002° |
γ | 90° |
Cell volume | 1620.05 ± 0.07 Å3 |
Cell temperature | 101 ± 3 K |
Ambient diffraction temperature | 101 ± 3 K |
Number of distinct elements | 3 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0968 |
Residual factor for significantly intense reflections | 0.0483 |
Weighted residual factors for significantly intense reflections | 0.0964 |
Weighted residual factors for all reflections included in the refinement | 0.118 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.025 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
---|---|---|---|
265345 (current) | 2021-05-20 | cif/ Adding structures of 1562695, 1562696 via cif-deposit CGI script. |
1562695.cif |
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Users of the data should acknowledge the original authors of the
structural data.