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Information card for entry 1563482
Preview
Coordinates | 1563482.cif |
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Original paper (by DOI) | HTML |
Formula | Cu Ga0.21 In0.79 Se2 |
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Calculated formula | Cu Ga0.214 In0.786 Se2 |
Title of publication | Structural investigation of the Cu2Se–In2Se3–Ga2Se3 phase diagram, X-ray photoemission and optical properties of the Cu1−z(In0.5Ga0.5)1+z/3Se2 compounds |
Authors of publication | Souilah, M.; Lafond, A.; Guillot-Deudon, C.; Harel, S.; Evain, M. |
Journal of publication | Journal of Solid State Chemistry |
Year of publication | 2010 |
Journal volume | 183 |
Journal issue | 10 |
Pages of publication | 2274 - 2280 |
a | 5.7478 ± 0.0001 Å |
b | 5.7478 ± 0.0001 Å |
c | 11.507 ± 0.002 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 380.16 ± 0.07 Å3 |
Cell temperature | 293 K |
Ambient diffraction temperature | 293 K |
Number of distinct elements | 4 |
Space group number | 122 |
Hermann-Mauguin space group symbol | I -4 2 d |
Hall space group symbol | I -4 2bw |
Residual factor for all reflections | 0.0662 |
Residual factor for significantly intense reflections | 0.0341 |
Weighted residual factors for significantly intense reflections | 0.0738 |
Weighted residual factors for all reflections included in the refinement | 0.0866 |
Goodness-of-fit parameter for significantly intense reflections | 1.2 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.16 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
---|---|---|---|
288574 (current) | 2023-12-31 | Corrected the misspelt variants of the '_refine_ls_structure_factor_coef' data name in entries 1563482, 2108404, 2108413, 7226934, 7701296, 7701297, 8000469. |
1563482.cif |
266469 | 2021-06-15 | cif/ Adding structures of 1563481, 1563482, 1563483, 1563484, 1563485, 1563486, 1563487, 1563488, 1563489, 1563490 via cif-deposit CGI script. |
1563482.cif |
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Users of the data should acknowledge the original authors of the
structural data.