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Information card for entry 1563484
Preview
| Coordinates | 1563484.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Cu Ga0.82 In0.18 Se2 |
|---|---|
| Calculated formula | Cu Ga0.824 In0.176 Se2 |
| Title of publication | Structural investigation of the Cu2Se‒In2Se3‒Ga2Se3 phase diagram, X-ray photoemission and optical properties of the Cu1−z(In0.5Ga0.5)1+z/3Se2 compounds |
| Authors of publication | Souilah, M.; Lafond, A.; Guillot-Deudon, C.; Harel, S.; Evain, M. |
| Journal of publication | Journal of Solid State Chemistry |
| Year of publication | 2010 |
| Journal volume | 183 |
| Journal issue | 10 |
| Pages of publication | 2274 - 2280 |
| a | 5.6501 ± 0.00005 Å |
| b | 5.6501 ± 0.00005 Å |
| c | 11.1486 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 355.904 ± 0.008 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 4 |
| Space group number | 122 |
| Hermann-Mauguin space group symbol | I -4 2 d |
| Hall space group symbol | I -4 2bw |
| Residual factor for all reflections | 0.0957 |
| Residual factor for significantly intense reflections | 0.0457 |
| Weighted residual factors for significantly intense reflections | 0.1014 |
| Weighted residual factors for all reflections included in the refinement | 0.1215 |
| Goodness-of-fit parameter for significantly intense reflections | 1.68 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.46 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 266469 (current) | 2021-06-15 | cif/ Adding structures of 1563481, 1563482, 1563483, 1563484, 1563485, 1563486, 1563487, 1563488, 1563489, 1563490 via cif-deposit CGI script. |
1563484.cif |
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Users of the data should acknowledge the original authors of the
structural data.