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Information card for entry 1566112
Preview
| Coordinates | 1566112.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C156 H228 Ce4 K4 N16 O22 |
|---|---|
| Calculated formula | C156 H228 Ce4 K4 N16 O22 |
| Title of publication | Electronic structure studies reveal 4f/5d mixing and its effect on bonding characteristics in Ce-imido and -oxo complexes |
| Authors of publication | Moreau, Liane M.; Lapsheva, Ekaterina; Amaro-Estrada, Jorge I.; Gau, Michael R.; Carroll, Patrick J.; Manor, Brian C.; Qiao, Yusen; Yang, Qiaomu; Lukens, Wayne W.; Sokaras, Dimosthenis; Schelter, Eric J.; Maron, Laurent; Booth, Corwin H. |
| Journal of publication | Chemical Science |
| Year of publication | 2022 |
| a | 18.7496 ± 0.0015 Å |
| b | 19.4808 ± 0.0015 Å |
| c | 25.7609 ± 0.0018 Å |
| α | 75.817 ± 0.004° |
| β | 71.717 ± 0.004° |
| γ | 70.697 ± 0.004° |
| Cell volume | 8326.6 ± 1.1 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0539 |
| Residual factor for significantly intense reflections | 0.0344 |
| Weighted residual factors for significantly intense reflections | 0.0792 |
| Weighted residual factors for all reflections included in the refinement | 0.0917 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.038 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 272213 (current) | 2022-01-25 | cif/ Adding structures of 1566111, 1566112 via cif-deposit CGI script. |
1566112.cif |
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Users of the data should acknowledge the original authors of the
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