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Information card for entry 1567381
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| Coordinates | 1567381.cif |
|---|---|
| Structure factors | 1567381.hkl |
| Original paper (by DOI) | HTML |
| Chemical name | Tin tellurium selenide |
|---|---|
| Formula | Se0.27 Sn Te0.73 |
| Calculated formula | Se0.27 Sn Te0.73 |
| Title of publication | Rerefinement of the crystal structure of SnTe~0.73(2)~Se~0.27(2)~ from single-crystal X-ray diffraction data |
| Authors of publication | Moris, Silvana; Galdámez, Antonio |
| Journal of publication | IUCrData |
| Year of publication | 2022 |
| Journal volume | 7 |
| Journal issue | 7 |
| Pages of publication | x220729 |
| a | 6.1595 ± 0.0005 Å |
| b | 6.1595 ± 0.0005 Å |
| c | 6.1595 ± 0.0005 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 233.69 ± 0.03 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 225 |
| Hermann-Mauguin space group symbol | F m -3 m |
| Hall space group symbol | -F 4 2 3 |
| Residual factor for all reflections | 0.0447 |
| Residual factor for significantly intense reflections | 0.0447 |
| Weighted residual factors for significantly intense reflections | 0.1149 |
| Weighted residual factors for all reflections included in the refinement | 0.1149 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.485 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
| Revision | Date | Message | Files |
|---|---|---|---|
| 276907 (current) | 2022-07-23 | cif/ hkl/ Adding structures of 1567381 via cif-deposit CGI script. |
1567381.cif 1567381.hkl |
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