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Information card for entry 1568439
Preview
| Coordinates | 1568439.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C40 H52 Ga P |
|---|---|
| Calculated formula | C40 H52 Ga P |
| SMILES | [Ga]1234(=Pc5c(c6c(cccc6C(C)C)C(C)C)cccc5c5c(C(C)C)cccc5C(C)C)[c]5([c]2([c]1([c]4([c]35C)C)C)C)C |
| Title of publication | Photochemical formation and reversible base-induced cleavage of a phosphagallene. |
| Authors of publication | Taeufer, T.; Dankert, F.; Michalik, D.; Pospech, J.; Bresien, J.; Hering-Junghans, C |
| Journal of publication | Chemical science |
| Year of publication | 2023 |
| Journal volume | 14 |
| Journal issue | 11 |
| Pages of publication | 3018 - 3023 |
| a | 10.1214 ± 0.0002 Å |
| b | 22.1032 ± 0.0005 Å |
| c | 16.8012 ± 0.0004 Å |
| α | 90° |
| β | 106.045 ± 0.001° |
| γ | 90° |
| Cell volume | 3612.27 ± 0.14 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0416 |
| Residual factor for significantly intense reflections | 0.0344 |
| Weighted residual factors for significantly intense reflections | 0.0847 |
| Weighted residual factors for all reflections included in the refinement | 0.0902 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.028 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 282291 (current) | 2023-04-04 | cif/ Updating files of 1568439, 1568440, 1568441 Original log message: Adding full bibliography for 1568439--1568441.cif. |
1568439.cif |
| 280960 | 2023-02-20 | cif/ Adding structures of 1568439, 1568440, 1568441 via cif-deposit CGI script. |
1568439.cif |
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Users of the data should acknowledge the original authors of the
structural data.