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Information card for entry 1569076
Preview
| Coordinates | 1569076.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | Isobavachalcone |
|---|---|
| Formula | C20 H20 O4 |
| Calculated formula | C20 H20 O4 |
| SMILES | Oc1c(C(=O)/C=C/c2ccc(O)cc2)ccc(O)c1CC=C(C)C |
| Title of publication | Naturally Occurring Chalcones with Aggregation-Induced Emission Enhancement Characteristics. |
| Authors of publication | Budziak-Wieczorek, Iwona; Kamiński, Daniel; Skrzypek, Alicja; Ciołek, Anna; Skrzypek, Tomasz; Janik-Zabrotowicz, Ewa; Arczewska, Marta |
| Journal of publication | Molecules (Basel, Switzerland) |
| Year of publication | 2023 |
| Journal volume | 28 |
| Journal issue | 8 |
| Pages of publication | 3412 |
| a | 19.354 ± 0.004 Å |
| b | 15.2873 ± 0.0018 Å |
| c | 7.2681 ± 0.0011 Å |
| α | 90° |
| β | 97.215 ± 0.018° |
| γ | 90° |
| Cell volume | 2133.4 ± 0.6 Å3 |
| Cell temperature | 296 K |
| Ambient diffraction temperature | 296 K |
| Number of distinct elements | 3 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.3082 |
| Residual factor for significantly intense reflections | 0.2758 |
| Weighted residual factors for significantly intense reflections | 0.5307 |
| Weighted residual factors for all reflections included in the refinement | 0.5557 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.918 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 283550 (current) | 2023-05-06 | cif/ Adding structures of 1569076 via cif-deposit CGI script. |
1569076.cif |
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Users of the data should acknowledge the original authors of the
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