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Information card for entry 1569995
Preview
| Coordinates | 1569995.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C68 H56 N4 Ni O2 S4 |
|---|---|
| Calculated formula | C68 H56 N4 Ni O2 S4 |
| Title of publication | Development of a scalar-based geometric parameterization approach for the crystal structure landscape of dithienylethene-based crystalline solids. |
| Authors of publication | Mitchell, Travis B.; Zhang, Xiaotong; Jerozal, Ronald T.; Chen, Yu Sheng; Wang, SuYin; Benedict, Jason B. |
| Journal of publication | IUCrJ |
| Year of publication | 2023 |
| Journal volume | 10 |
| Journal issue | 6 |
| a | 9.8621 ± 0.0006 Å |
| b | 21.6164 ± 0.0013 Å |
| c | 67.069 ± 0.004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 14298 ± 1.5 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 6 |
| Space group number | 70 |
| Hermann-Mauguin space group symbol | F d d d :2 |
| Hall space group symbol | -F 2uv 2vw |
| Residual factor for all reflections | 0.0435 |
| Residual factor for significantly intense reflections | 0.0378 |
| Weighted residual factors for significantly intense reflections | 0.0977 |
| Weighted residual factors for all reflections included in the refinement | 0.1011 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.086 |
| Diffraction radiation wavelength | 0.41328 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 286553 (current) | 2023-09-27 | cif/ Adding structures of 1569988, 1569989, 1569990, 1569991, 1569992, 1569993, 1569994, 1569995, 1569996, 1569997, 1569998, 1569999, 1570000, 1570001, 1570002, 1570003, 1570004, 1570005, 1570006 via cif-deposit CGI script. |
1569995.cif |
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Users of the data should acknowledge the original authors of the
structural data.