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Information card for entry 1570432
Preview
| Coordinates | 1570432.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C34 H85.6 F12 Mg N14 O8 S4 |
|---|---|
| Calculated formula | C34 H85.6 F12 Mg N14 O8 S4 |
| Title of publication | Synergy between the coordination and trace ionization of co-solvents enables reversible magnesium electroplating/stripping behavior |
| Authors of publication | Wang, Min; Sun, Wenhao; Zhang, Kun; Zhang, Zhonghua; Du, Aobing; Dong, Shanmu; Zhang, Jinlei; Liu, Jing; Chen, Xi; Zhou, Zhenfang; Li, Fujun; Li, Zhenjiang; Li, Guicun; Cui, Guanglei |
| Journal of publication | Energy & Environmental Science |
| Year of publication | 2024 |
| Journal volume | 17 |
| Journal issue | 2 |
| Pages of publication | 630 - 641 |
| a | 9.611 ± 0.002 Å |
| b | 15.13 ± 0.003 Å |
| c | 21.533 ± 0.005 Å |
| α | 91.969 ± 0.008° |
| β | 96.72 ± 0.009° |
| γ | 101.57 ± 0.009° |
| Cell volume | 3041.1 ± 1.1 Å3 |
| Cell temperature | 170 K |
| Ambient diffraction temperature | 170 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1099 |
| Residual factor for significantly intense reflections | 0.064 |
| Weighted residual factors for significantly intense reflections | 0.1495 |
| Weighted residual factors for all reflections included in the refinement | 0.1746 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.042 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 289562 (current) | 2024-02-04 | cif/ Updating files of 1570432 Original log message: Adding full bibliography for 1570432.cif. |
1570432.cif |
| 287868 | 2023-11-30 | cif/ Adding structures of 1570432 via cif-deposit CGI script. |
1570432.cif |
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Users of the data should acknowledge the original authors of the
structural data.