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Information card for entry 1571596
Preview
| Coordinates | 1571596.cif |
|---|---|
| Original IUCr paper | HTML |
| Formula | C41 H30 N4 O |
|---|---|
| Calculated formula | C41 H28 N4 |
| Title of publication | Analysis of COF-300 synthesis: probing degradation processes and 3D electron diffraction structure. |
| Authors of publication | Bourda, Laurens; Bhandary, Subhrajyoti; Ito, Sho; Göb, Christian R; Van Der Voort, Pascal; Van Hecke, Kristof |
| Journal of publication | IUCrJ |
| Year of publication | 2024 |
| Journal volume | 11 |
| Journal issue | 4 |
| a | 20.7 ± 0.3 Å |
| b | 20.7 ± 0.3 Å |
| c | 8.8 ± 0.2 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3771 ± 12 Å3 |
| Cell temperature | 298 ± 1 K |
| Ambient diffraction temperature | 298 ± 1 K |
| Number of distinct elements | 4 |
| Space group number | 88 |
| Hermann-Mauguin space group symbol | I 41/a :2 |
| Hall space group symbol | -I 4ad |
| Residual factor for all reflections | 0.1808 |
| Residual factor for significantly intense reflections | 0.1372 |
| Weighted residual factors for significantly intense reflections | 0.3425 |
| Weighted residual factors for all reflections included in the refinement | 0.3793 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.316 |
| Diffraction radiation probe | electron |
| Diffraction radiation wavelength | 0.0251 Å |
| Diffraction radiation type | transmissionelectronmicroscope |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 291819 (current) | 2024-05-11 | cif/ Adding structures of 1571596 via cif-deposit CGI script. |
1571596.cif |
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Users of the data should acknowledge the original authors of the
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