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Information card for entry 1575970
Preview
| Coordinates | 1575970.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C50 H42 B Cu N4 |
|---|---|
| Calculated formula | C50 H42 B Cu N4 |
| Title of publication | Complexation-Induced Reduction of CuII to CuI Promoted by a Distorted Tetrahedral N4-Type Schiff-Base Ligand |
| Authors of publication | Takeyama, Tomoyuki; Shirabe, Daisuke; Hamamoto, Nobutsugu; Ohta, Takehiro |
| Journal of publication | Inorganics |
| Year of publication | 2025 |
| Journal volume | 13 |
| Journal issue | 10 |
| Pages of publication | 327 |
| a | 11.4008 ± 0.0003 Å |
| b | 11.5395 ± 0.0004 Å |
| c | 15.8744 ± 0.0006 Å |
| α | 92.725 ± 0.003° |
| β | 108.344 ± 0.003° |
| γ | 99.419 ± 0.003° |
| Cell volume | 1944.61 ± 0.12 Å3 |
| Cell temperature | 100 ± 0.1 K |
| Ambient diffraction temperature | 100 ± 0.1 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0577 |
| Residual factor for significantly intense reflections | 0.0508 |
| Weighted residual factors for significantly intense reflections | 0.137 |
| Weighted residual factors for all reflections included in the refinement | 0.1424 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.022 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 302825 (current) | 2025-10-07 | cif/ Adding structures of 1575970 via cif-deposit CGI script. |
1575970.cif |
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Users of the data should acknowledge the original authors of the
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