Crystallography Open Database

Information card for entry 2022052

2022051 << 2022052 >> 2022053

Preview

Coordinates	2022052.cif
Original paper (by DOI)	HTML

Structure parameters

Formula	C6 H6 N12 O12
Calculated formula	C6 H6 N12 O12
SMILES	O=N(=O)N1[C@H]2N(N(=O)=O)C3N(N(=O)=O)[C@H]2N(N(=O)=O)[C@H]2N(N(=O)=O)C3N(N(=O)=O)[C@@H]12
Title of publication	TAAM: a reliable and user friendly tool for hydrogen-atom location using routine X-ray diffraction data
Authors of publication	Jha, Kunal Kumar; Gruza, Barbara; Kumar, Prashant; Chodkiewicz, Michal Leszek; Dominiak, Paulina Maria
Journal of publication	Acta Crystallographica Section B Structural Science, Crystal Engineering and Materials
Year of publication	2020
Journal volume	76
Journal issue	3
a	8.789 ± 0.001 Å
b	12.474 ± 0.001 Å
c	13.279 ± 0.001 Å
α	90°
β	106.578 ± 0.001°
γ	90°
Cell volume	1395.3 ± 0.2 Å³
Cell temperature	100 K
Ambient diffraction temperature	100 K
Number of distinct elements	4
Space group number	14
Hermann-Mauguin space group symbol	P 1 21/n 1
Hall space group symbol	-P 2yn
Residual factor for all reflections	0.0206
Residual factor for significantly intense reflections	0.0203
Weighted residual factors for significantly intense reflections	0.0506
Weighted residual factors for all reflections included in the refinement	0.0509
Goodness-of-fit parameter for all reflections included in the refinement	1.0718
Diffraction radiation wavelength	0.503 Å
Diffraction radiation type	synchrotron
Has coordinates	Yes
Has disorder	No
Has F_obs	No

Version history

Revision	Date	Message	Files
250631 (current)	2020-04-10	cif/ Adding structures of 2022052 via cif-deposit CGI script.	2022052.cif