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Information card for entry 2022081
Preview
Coordinates | 2022081.cif |
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Original paper (by DOI) | HTML |
Formula | C6 H15 Cl N2 O3 |
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Calculated formula | C6 H15 Cl N2 O3 |
SMILES | [Cl-].O=C([O-])[C@@H]([NH3+])CC[C@@H](O)C[NH3+] |
Title of publication | TAAM: a reliable and user friendly tool for hydrogen-atom location using routine X-ray diffraction data |
Authors of publication | Jha, Kunal Kumar; Gruza, Barbara; Kumar, Prashant; Chodkiewicz, Michal Leszek; Dominiak, Paulina Maria |
Journal of publication | Acta Crystallographica Section B Structural Science, Crystal Engineering and Materials |
Year of publication | 2020 |
Journal volume | 76 |
Journal issue | 3 |
a | 5.4315 ± 0.0001 Å |
b | 9.8019 ± 0.0001 Å |
c | 17.3505 ± 0.0002 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 923.72 ± 0.02 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 5 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0147 |
Residual factor for significantly intense reflections | 0.0145 |
Weighted residual factors for significantly intense reflections | 0.0367 |
Weighted residual factors for all reflections included in the refinement | 0.0368 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.1883 |
Diffraction radiation wavelength | 0.475 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
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250660 (current) | 2020-04-10 | cif/ Adding structures of 2022081 via cif-deposit CGI script. |
2022081.cif |
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Users of the data should acknowledge the original authors of the
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