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Information card for entry 2241250
Preview
Coordinates | 2241250.cif |
---|---|
Structure factors | 2241250.hkl |
Original paper (by DOI) | HTML |
Chemical name | 1,1,2,2-Tetramethyl-1,2-bis(2,3,4,5-tetramethylcyclopenta-2,4-dien-1-yl)disilane |
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Formula | C22 H38 Si2 |
Calculated formula | C22 H38 Si2 |
SMILES | C1(C(=C(C(=C1C)C)C)C)[Si](C)(C)[Si](C)(C)C1C(=C(C(=C1C)C)C)C |
Title of publication | Crystal structure of 1,1,2,2-tetramethyl-1,2-bis(2,3,4,5-tetramethylcyclopenta-2,4-dien-1-yl)disilane |
Authors of publication | Godemann, Christian; Spannenberg, Anke; Beweries, Torsten |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2015 |
Journal volume | 71 |
Journal issue | 11 |
Pages of publication | o888 |
a | 8.779 ± 0.0002 Å |
b | 15.3039 ± 0.0004 Å |
c | 16.4355 ± 0.0004 Å |
α | 90° |
β | 93.678 ± 0.001° |
γ | 90° |
Cell volume | 2203.61 ± 0.09 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 3 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0403 |
Residual factor for significantly intense reflections | 0.0336 |
Weighted residual factors for significantly intense reflections | 0.0905 |
Weighted residual factors for all reflections included in the refinement | 0.0967 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.06 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
Revision | Date | Message | Files |
---|---|---|---|
181913 (current) | 2016-04-06 | hkl/2/24/ (antanas@echidna) Adding IUCr specific svn headers to multiple entries in subrange 2/24/12. |
2241250.cif 2241250.hkl |
169843 | 2015-10-29 | cif/ hkl/ Adding structures of 2241250 via cif-deposit CGI script. |
2241250.cif 2241250.hkl |
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Users of the data should acknowledge the original authors of the
structural data.