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Information card for entry 2241402
Preview
Coordinates | 2241402.cif |
---|---|
Structure factors | 2241402.hkl |
Original paper (by DOI) | HTML |
Chemical name | Bis{<i>N</i>-[(diethylamino)dimethylsilyl]anilido-κ^2^<i>N</i>,<i>N</i>'}zinc |
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Formula | C24 H42 N4 Si2 Zn |
Calculated formula | C24 H42 N4 Si2 Zn |
SMILES | c1(N2[Si](C)(C)[N](CC)(CC)[Zn]32N(c2ccccc2)[Si](C)(C)[N]3(CC)CC)ccccc1 |
Title of publication | Crystal structure of bis{<i>N</i>-[(diethylamino)dimethylsilyl]anilido-κ^2^<i>N</i>,<i>N</i>'}zinc |
Authors of publication | Chen, Juan |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2015 |
Journal volume | 71 |
Journal issue | 12 |
Pages of publication | m246 |
a | 29.7954 ± 0.0012 Å |
b | 21.3566 ± 0.0008 Å |
c | 8.5844 ± 0.0003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 5462.5 ± 0.4 Å3 |
Cell temperature | 200 ± 2 K |
Ambient diffraction temperature | 200 ± 2 K |
Number of distinct elements | 5 |
Space group number | 43 |
Hermann-Mauguin space group symbol | F d d 2 |
Hall space group symbol | F 2 -2d |
Residual factor for all reflections | 0.0204 |
Residual factor for significantly intense reflections | 0.0189 |
Weighted residual factors for significantly intense reflections | 0.05 |
Weighted residual factors for all reflections included in the refinement | 0.0506 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.115 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
Revision | Date | Message | Files |
---|---|---|---|
181915 (current) | 2016-04-06 | hkl/2/24/ (antanas@echidna) Adding IUCr specific svn headers to multiple entries in subrange 2/24/14. |
2241402.cif 2241402.hkl |
171486 | 2015-12-13 | cif/ hkl/ Adding structures of 2241402 via cif-deposit CGI script. |
2241402.cif 2241402.hkl |
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Users of the data should acknowledge the original authors of the
structural data.