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Information card for entry 2241771
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| Coordinates | 2241771.cif |
|---|---|
| Structure factors | 2241771.hkl |
| Original IUCr paper | HTML |
| Common name | Yttrium copper (II) tellurite (IV) nitrate trihydrate |
|---|---|
| Chemical name | Yttrium(III) copper(II) bis[trioxidotellurate(IV)] nitrate trihydrate |
| Formula | Cu H6 N O12 Te2 Y |
| Calculated formula | Cu H6 N O12 Te2 Y |
| Title of publication | YCu(TeO~3~)~2~(NO~3~)(H~2~O)~3~: a novel layered tellurite |
| Authors of publication | Mills, Stuart J.; Dunstan, Maja A.; Christy, Andrew G. |
| Journal of publication | Acta Crystallographica Section E |
| Year of publication | 2016 |
| Journal volume | 72 |
| Journal issue | 8 |
| Pages of publication | 1138 - 1142 |
| a | 7.256 ± 0.0015 Å |
| b | 20.654 ± 0.004 Å |
| c | 7.016 ± 0.0014 Å |
| α | 90° |
| β | 94.63 ± 0.03° |
| γ | 90° |
| Cell volume | 1048 ± 0.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0338 |
| Residual factor for significantly intense reflections | 0.0329 |
| Weighted residual factors for significantly intense reflections | 0.0733 |
| Weighted residual factors for all reflections included in the refinement | 0.0737 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.14 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
| Revision | Date | Message | Files |
|---|---|---|---|
| 184528 (current) | 2016-07-20 | cif/ hkl/ Adding structures of 2241771 via cif-deposit CGI script. |
2241771.cif 2241771.hkl |
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