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Information card for entry 2241830
Preview
Coordinates | 2241830.cif |
---|---|
Structure factors | 2241830.hkl |
Original IUCr paper | HTML |
Chemical name | [μ-Ethane-1,2-diylbis(diphenylphosphane)-κ^2^<i>P</i>:<i>P</i>']bis[pentacarbonyltungsten(0)] |
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Formula | C36 H24 O10 P2 W2 |
Calculated formula | C36 H24 O10 P2 W2 |
SMILES | c1(ccccc1)[P](c1ccccc1)([W](C#[O])(C#[O])(C#[O])(C#[O])C#[O])CC[P](c1ccccc1)(c1ccccc1)[W](C#[O])(C#[O])(C#[O])(C#[O])C#[O] |
Title of publication | Crystal structure of (OC)~5~W(μ-dppe)W(CO)~5~ |
Authors of publication | Drake, Hannah F.; Wheeler, Kraig A.; Bellott, Brian J. |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2016 |
Journal volume | 72 |
Journal issue | 10 |
Pages of publication | 1383 - 1385 |
a | 9.8193 ± 0.0004 Å |
b | 16.0492 ± 0.0007 Å |
c | 11.3312 ± 0.0005 Å |
α | 90° |
β | 96.511 ± 0.002° |
γ | 90° |
Cell volume | 1774.19 ± 0.13 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0239 |
Residual factor for significantly intense reflections | 0.0206 |
Weighted residual factors for significantly intense reflections | 0.0465 |
Weighted residual factors for all reflections included in the refinement | 0.0478 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.057 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
Revision | Date | Message | Files |
---|---|---|---|
186170 (current) | 2016-09-06 | cif/ hkl/ Adding structures of 2241830 via cif-deposit CGI script. |
2241830.cif 2241830.hkl |
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Users of the data should acknowledge the original authors of the
structural data.