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Information card for entry 2242213
Preview
| Coordinates | 2242213.cif |
|---|---|
| Structure factors | 2242213.hkl |
| Original IUCr paper | HTML |
| Chemical name | <i>catena</i>-Poly[[[bis(ethylenediamine)platinum(II)]-μ-bromido-[bis(ethylenediamine)platinum(IV)]-μ-bromido] tetrakis(2-bromoethanesulfonate) dihydrate] |
|---|---|
| Formula | C16 H52 Br6 N8 O14 Pt2 S4 |
| Calculated formula | C16 H52 Br6 N8 O14 Pt2 S4 |
| Title of publication | A one-dimensional bromide-bridged Pt^II^/Pt^IV^ mixed-valence complex with a 2-bromoethanesulfonate counter-ion |
| Authors of publication | Matsushita, Nobuyuki; Taira, Ayako; Taoka, Yoshiya |
| Journal of publication | Acta Crystallographica Section E |
| Year of publication | 2017 |
| Journal volume | 73 |
| Journal issue | 8 |
| Pages of publication | 1108 - 1112 |
| a | 14.3568 ± 0.0008 Å |
| b | 27.0628 ± 0.0013 Å |
| c | 5.5212 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2145.18 ± 0.18 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 18 |
| Hermann-Mauguin space group symbol | P 21 21 2 |
| Hall space group symbol | P 2 2ab |
| Residual factor for all reflections | 0.0654 |
| Residual factor for significantly intense reflections | 0.0424 |
| Weighted residual factors for significantly intense reflections | 0.0941 |
| Weighted residual factors for all reflections included in the refinement | 0.1026 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.03 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
| Revision | Date | Message | Files |
|---|---|---|---|
| 199178 (current) | 2017-07-25 | cif/ hkl/ Adding structures of 2242213 via cif-deposit CGI script. |
2242213.cif 2242213.hkl |
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Users of the data should acknowledge the original authors of the
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