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Information card for entry 2243257
Preview
Coordinates | 2243257.cif |
---|---|
Structure factors | 2243257.hkl |
Original IUCr paper | HTML |
Chemical name | 2-Iodo-4-(pentafluoro-λ^6^-sulfanyl)benzonitrile |
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Formula | C7 H3 F5 I N S |
Calculated formula | C7 H3 F5 I N S |
SMILES | c1(c(cc(cc1)S(F)(F)(F)(F)F)I)C#N |
Title of publication | Structural characterization and Hirshfeld surface analysis of 2-iodo-4-(pentafluoro-λ^6^-sulfanyl)benzonitrile |
Authors of publication | González Espiet, Jean C.; Cintrón Cruz, Juan A.; Piñero Cruz, Dalice M. |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2020 |
Journal volume | 76 |
Journal issue | 2 |
Pages of publication | 231 - 234 |
a | 8.0634 ± 0.0001 Å |
b | 7.7088 ± 0.0001 Å |
c | 16.441 ± 0.0003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 1021.96 ± 0.03 Å3 |
Cell temperature | 300 ± 0.1 K |
Ambient diffraction temperature | 300 K |
Number of distinct elements | 6 |
Space group number | 62 |
Hermann-Mauguin space group symbol | P n m a |
Hall space group symbol | -P 2ac 2n |
Residual factor for all reflections | 0.0435 |
Residual factor for significantly intense reflections | 0.0417 |
Weighted residual factors for significantly intense reflections | 0.1098 |
Weighted residual factors for all reflections included in the refinement | 0.1114 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.033 |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
Revision | Date | Message | Files |
---|---|---|---|
247004 (current) | 2020-01-18 | cif/ hkl/ Adding structures of 2243257 via cif-deposit CGI script. |
2243257.cif 2243257.hkl |
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