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Information card for entry 2243515
Preview
Coordinates | 2243515.cif |
---|---|
Structure factors | 2243515.hkl |
Original IUCr paper | HTML |
Chemical name | Bis(tetramethylthiourea-κ<i>S</i>)bis(thiocyanato-κ<i>N</i>)cobalt(II) |
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Formula | C12 H24 Co N6 S4 |
Calculated formula | C12 H24 Co N6 S4 |
SMILES | [Co](N=C=S)(N=C=S)([S]=C(N(C)C)N(C)C)[S]=C(N(C)C)N(C)C |
Title of publication | Crystal structure of bis(tetramethylthiourea-κ<i>S</i>)bis(thiocyanato-κ<i>N</i>)cobalt(II) |
Authors of publication | Jochim, Aleksej; Radulovic, Rastko; Jess, Inke; Näther, Christian |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2020 |
Journal volume | 76 |
Journal issue | 8 |
Pages of publication | 1373 - 1377 |
a | 13.3288 ± 0.0013 Å |
b | 11.214 ± 0.0008 Å |
c | 13.8579 ± 0.0013 Å |
α | 90° |
β | 97.667 ± 0.008° |
γ | 90° |
Cell volume | 2052.8 ± 0.3 Å3 |
Cell temperature | 200 ± 2 K |
Ambient diffraction temperature | 200 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0377 |
Residual factor for significantly intense reflections | 0.0308 |
Weighted residual factors for significantly intense reflections | 0.0809 |
Weighted residual factors for all reflections included in the refinement | 0.084 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.018 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
Revision | Date | Message | Files |
---|---|---|---|
254728 (current) | 2020-08-01 | cif/ hkl/ Adding structures of 2243515 via cif-deposit CGI script. |
2243515.cif 2243515.hkl |
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Users of the data should acknowledge the original authors of the
structural data.