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Information card for entry 2243547
Preview
| Coordinates | 2243547.cif |
|---|---|
| Structure factors | 2243547.hkl |
| Original IUCr paper | HTML |
| Chemical name | Bis(<i>N</i>,<i>N</i>'-dimethylthiourea-κ<i>S</i>)bis(thiocyanato-κ<i>N</i>)cobalt(II) |
|---|---|
| Formula | C8 H16 Co N6 S4 |
| Calculated formula | C8 H16 Co N6 S4 |
| Title of publication | Crystal structure of bis(<i>N</i>,<i>N</i>'-dimethylthiourea-κ<i>S</i>)bis(thiocyanato-κ<i>N</i>)cobalt(II) |
| Authors of publication | Jochim, Aleksej; Radulovic, Rastko; Jess, Inke; Näther, Christian |
| Journal of publication | Acta Crystallographica Section E |
| Year of publication | 2020 |
| Journal volume | 76 |
| Journal issue | 9 |
| Pages of publication | 1476 - 1481 |
| a | 16.807 ± 0.0008 Å |
| b | 14.4212 ± 0.0006 Å |
| c | 15.5669 ± 0.0009 Å |
| α | 90° |
| β | 118.744 ± 0.004° |
| γ | 90° |
| Cell volume | 3308.1 ± 0.3 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0454 |
| Residual factor for significantly intense reflections | 0.0391 |
| Weighted residual factors for significantly intense reflections | 0.1013 |
| Weighted residual factors for all reflections included in the refinement | 0.1054 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.067 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
| Revision | Date | Message | Files |
|---|---|---|---|
| 255476 (current) | 2020-08-20 | cif/ hkl/ Adding structures of 2243547 via cif-deposit CGI script. |
2243547.cif 2243547.hkl |
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Users of the data should acknowledge the original authors of the
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