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Information card for entry 2243679
Preview
| Coordinates | 2243679.cif |
|---|---|
| Structure factors | 2243679.hkl |
| Original IUCr paper | HTML |
| Chemical name | Bis(tetramethylthiourea-κ<i>S</i>)bis(thiocyanato-κ<i>N</i>)nickel(II) |
|---|---|
| Formula | C12 H24 N6 Ni S4 |
| Calculated formula | C12 H24 N6 Ni S4 |
| SMILES | [Ni](N=C=S)(N=C=S)([S]=C(N(C)C)N(C)C)[S]=C(N(C)C)N(C)C |
| Title of publication | Crystal structure of bis(tetramethylthiourea-κ<i>S</i>)bis(thiocyanato-κ<i>N</i>)nickel(II) |
| Authors of publication | Jochim, Aleksej; Radulovic, Rastko; Jess, Inke; Näther, Christian |
| Journal of publication | Acta Crystallographica Section E |
| Year of publication | 2020 |
| Journal volume | 76 |
| Journal issue | 12 |
| Pages of publication | 1841 - 1845 |
| a | 10.7245 ± 0.0003 Å |
| b | 6.205 ± 0.0003 Å |
| c | 15.1579 ± 0.0005 Å |
| α | 90° |
| β | 103.14 ± 0.003° |
| γ | 90° |
| Cell volume | 982.28 ± 0.06 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 13 |
| Hermann-Mauguin space group symbol | P 1 2/c 1 |
| Hall space group symbol | -P 2yc |
| Residual factor for all reflections | 0.0497 |
| Residual factor for significantly intense reflections | 0.0384 |
| Weighted residual factors for significantly intense reflections | 0.0929 |
| Weighted residual factors for all reflections included in the refinement | 0.0981 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.046 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
| Revision | Date | Message | Files |
|---|---|---|---|
| 259161 (current) | 2020-11-18 | cif/ hkl/ Adding structures of 2243679 via cif-deposit CGI script. |
2243679.cif 2243679.hkl |
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Users of the data should acknowledge the original authors of the
structural data.