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Information card for entry 2244049
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| Coordinates | 2244049.cif |
|---|---|
| Structure factors | 2244049.hkl |
| Original IUCr paper | HTML |
| Chemical name | 2-(Benzo[<i>d</i>]thiazol-2-yl)-3,3-bis(ethylsulfanyl)acrylonitrile |
|---|---|
| Formula | C14 H14 N2 S3 |
| Calculated formula | C14 H14 N2 S3 |
| SMILES | s1c(nc2ccccc12)C(=C(SCC)SCC)C#N |
| Title of publication | Crystal structure of 2-(benzo[<i>d</i>]thiazol-2-yl)-3,3-bis(ethylsulfanyl)acrylonitrile |
| Authors of publication | Azzam, Rasha A.; Elgemeie, Galal H.; Elsayed, Rasha E.; Gad, Nagwa M.; Jones, Peter G. |
| Journal of publication | Acta Crystallographica Section E |
| Year of publication | 2022 |
| Journal volume | 78 |
| Journal issue | 4 |
| a | 10.0771 ± 0.0003 Å |
| b | 16.0292 ± 0.0005 Å |
| c | 17.8768 ± 0.0006 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2887.6 ± 0.16 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.0449 |
| Residual factor for significantly intense reflections | 0.0322 |
| Weighted residual factors for significantly intense reflections | 0.0717 |
| Weighted residual factors for all reflections included in the refinement | 0.0773 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.048 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
| Revision | Date | Message | Files |
|---|---|---|---|
| 273638 (current) | 2022-03-11 | cif/ hkl/ Adding structures of 2244049 via cif-deposit CGI script. |
2244049.cif 2244049.hkl |
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