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Information card for entry 2300388
Preview
| Coordinates | 2300388.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | As0.84 Cu1.08 Mn0.94 |
|---|---|
| Calculated formula | As0.96 Cu Mn0.86 |
| Title of publication | Obtaining the structure factors for an epitaxial film using Cu X-ray radiation |
| Authors of publication | Wadley, P.; Crespi, A.; Gázquez, J.; Roldán, M.A.; García, P.; Novak, V.; Campion, R.; Jungwirth, T.; Rinaldi, C.; Martí, X.; Holy, V.; Frontera, C.; Rius, J. |
| Journal of publication | Journal of Applied Crystallography |
| Year of publication | 2013 |
| Journal volume | 46 |
| Journal issue | 6 |
| Pages of publication | 1749 - 1754 |
| a | 3.82 ± 0.01 Å |
| b | 3.82 ± 0.01 Å |
| c | 6.318 ± 0.01 Å |
| α | 90 ± 0.02° |
| β | 90 ± 0.02° |
| γ | 90 ± 0.02° |
| Cell volume | 92.2 ± 0.4 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 129 |
| Hermann-Mauguin space group symbol | P 4/n m m :2 |
| Hall space group symbol | -P 4a 2a |
| Residual factor for all reflections | 0.0933 |
| Residual factor for significantly intense reflections | 0.046 |
| Weighted residual factors for significantly intense reflections | 0.0679 |
| Weighted residual factors for all reflections included in the refinement | 0.1066 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.391 |
| Diffraction radiation wavelength | 1.5406 Å |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 176809 (current) | 2016-02-21 | cif/ (antanas@kurmis) Replacing _[local]_cod_* tags with their equivalents from the COD CIF dictionary in multiple entries in range 2. |
2300388.cif |
| 92314 | 2014-01-12 | cif/ Adding structures of 2300388 via cif-deposit CGI script. |
2300388.cif |
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Users of the data should acknowledge the original authors of the
structural data.