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Information card for entry 2300644
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| Coordinates | 2300644.cif |
|---|---|
| Structure factors | 2300644.hkl |
| Original paper (by DOI) | HTML |
| Common name | Mordenite |
|---|---|
| Chemical name | Mordenite |
| Formula | O96 Si48 |
| Calculated formula | O96 Si48 |
| Title of publication | High-throughput continuous rotation electron diffraction data acquisition <i>via</i> software automation |
| Authors of publication | Cichocka, Magdalena Ola; Ångström, Jonas; Wang, Bin; Zou, Xiaodong; Smeets, Stef |
| Journal of publication | Journal of Applied Crystallography |
| Year of publication | 2018 |
| Journal volume | 51 |
| Journal issue | 6 |
| a | 18.11 ± 0.004 Å |
| b | 20.53 ± 0.004 Å |
| c | 7.528 ± 0.0015 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2798.9 ± 1 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 2 |
| Space group number | 63 |
| Hermann-Mauguin space group symbol | C m c m |
| Hall space group symbol | -C 2c 2 |
| Residual factor for all reflections | 0.3007 |
| Residual factor for significantly intense reflections | 0.2841 |
| Weighted residual factors for significantly intense reflections | 0.5628 |
| Weighted residual factors for all reflections included in the refinement | 0.5753 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.647 |
| Diffraction radiation probe | electron |
| Diffraction radiation wavelength | 0.0251 Å |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
| Revision | Date | Message | Files |
|---|---|---|---|
| 212145 (current) | 2018-11-23 | cif/ hkl/ Adding structures of 2300644, 2300645 via cif-deposit CGI script. |
2300644.cif 2300644.hkl |
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Users of the data should acknowledge the original authors of the
structural data.