Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 2300672
Preview
Coordinates | 2300672.cif |
---|---|
Structure factors | 2300672.hkl |
Original paper (by DOI) | HTML |
Formula | C6 D12 N4 |
---|---|
Calculated formula | C6 D12 N4 |
Title of publication | High-pressure sapphire capillary cell for synchrotron single-crystal X-ray diffraction measurements to 1500 bar |
Authors of publication | McMonagle, Charles J.; Allan, David R.; Warren, Mark R.; Kamenev, Konstantin V.; Turner, Gemma F.; Moggach, Stephen A. |
Journal of publication | Journal of Applied Crystallography |
Year of publication | 2020 |
Journal volume | 53 |
Journal issue | 6 |
Pages of publication | 1519 - 1523 |
a | 7.0195 ± 0.0001 Å |
b | 7.0195 ± 0.0001 Å |
c | 7.0195 ± 0.0001 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 345.874 ± 0.009 Å3 |
Cell temperature | 297 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 3 |
Space group number | 217 |
Hermann-Mauguin space group symbol | I -4 3 m |
Hall space group symbol | I -4 2 3 |
Residual factor for all reflections | 0.0311 |
Residual factor for significantly intense reflections | 0.0307 |
Weighted residual factors for significantly intense reflections | 0.0922 |
Weighted residual factors for all reflections included in the refinement | 0.0925 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.325 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
Revision | Date | Message | Files |
---|---|---|---|
259638 (current) | 2020-12-07 | cif/ Updating files of 2300672 Original log message: Adding full bibliography for 2300672.cif. |
2300672.cif 2300672.hkl |
259162 | 2020-11-18 | cif/ hkl/ Adding structures of 2300672 via cif-deposit CGI script. |
2300672.cif 2300672.hkl |
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.