Crystallography Open Database

Information card for entry 2300767

Preview

Coordinates	2300767.cif
Original paper (by DOI)	HTML

Structure parameters

Formula	F4 Xe
Calculated formula	F4 Xe
Title of publication	A simple cryotransfer method for 3D electron diffraction measurements of highly sensitive samples
Authors of publication	Gurung, Kshitij; Uran, Erik; Motaln, Klemen; Brázda, Petr; Radan, Kristian; Lozinšek, Matic; Palatinus, Lukáš
Journal of publication	Journal of Applied Crystallography
Year of publication	2025
Journal volume	58
Journal issue	3
Pages of publication	1079 - 1084
a	5.0148 ± 0.0008 Å
b	5.7392 ± 0.0015 Å
c	5.9043 ± 0.0014 Å
α	90°
β	100.866 ± 0.015°
γ	90°
Cell volume	166.88 ± 0.07 Å³
Cell temperature	100 K
Ambient diffraction temperature	100 K
Number of distinct elements	2
Space group number	14
Hermann-Mauguin space group symbol	P 1 21/n 1
Hall space group symbol	-P 2yn
Residual factor for all reflections	0.1341
Residual factor for significantly intense reflections	0.1073
Weighted residual factors for significantly intense reflections	0.1196
Weighted residual factors for all reflections included in the refinement	0.1221
Goodness-of-fit parameter for significantly intense reflections	0
Goodness-of-fit parameter for all reflections included in the refinement	2.5236
Diffraction radiation probe	electron
Diffraction radiation wavelength	0.0251 Å
Diffraction radiation type	electrons200keV
Has coordinates	Yes
Has disorder	No
Has F_obs	No

Version history

Revision	Date	Message	Files
299945 (current)	2025-06-03	cif/ Updating files of 2300766, 2300767, 2300768 Original log message: Adding full bibliography for 2300766--2300768.cif.	2300767.cif
299505	2025-05-03	cif/ Adding structures of 2300766, 2300767, 2300768 via cif-deposit CGI script.	2300767.cif