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Information card for entry 2311093
Preview
| Coordinates | 2311093.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | sodium hafnium disilicate |
|---|---|
| Formula | Hf Na2 O7 Si2 |
| Calculated formula | Hf Na2 O7 Si2 |
| Title of publication | Crystal structure of Na~2~HfSi~2~O~7~ by Rietveld refinement |
| Authors of publication | Massoni, Nicolas; Pierrick, Chevreux |
| Journal of publication | Acta Crystallographica, Section e |
| Year of publication | 2016 |
| Journal volume | 72 |
| Pages of publication | 1434 |
| a | 6.6123 ± 0.0002 Å |
| b | 8.7948 ± 0.0003 Å |
| c | 5.41074 ± 0.00015 Å |
| α | 92.603 ± 0.002° |
| β | 94.0843 ± 0.0018° |
| γ | 71.3262 ± 0.0018° |
| Cell volume | 297.249 ± 0.016 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0236 |
| Residual factor for significantly intense reflections | 0.0236 |
| Weighted residual factors for all reflections | 0.0297 |
| Weighted residual factors for significantly intense reflections | 0.0297 |
| Goodness-of-fit parameter for all reflections | 2.23 |
| Goodness-of-fit parameter for all reflections included in the refinement | 2.23 |
| Method of determination | powder diffraction |
| Diffraction radiation wavelength | 1.54176 Å |
| Diffraction radiation type | CuKα~1~ |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 207162 (current) | 2018-03-28 | cif/ Adding structures of 2311093 via cif-deposit CGI script. |
2311093.cif |
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