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Information card for entry 2311663
Preview
| Coordinates | 2311663.cif |
|---|---|
| Original IUCr paper | HTML |
| Formula | C5 H4 Fe N6 Na2 O3 |
|---|---|
| Calculated formula | C5 H4 Fe N6 Na2 O3 |
| SMILES | O=N[Fe](C#N)(C#N)(C#N)(C#N)C#N.[Na+].O.[Na+].O |
| Title of publication | XPAD X-ray hybrid pixel detector for charge density quality diffracted intensities on laboratory equipment. |
| Authors of publication | Wenger, Emmanuel; Dahaoui, Slimane; Alle, Paul; Parois, Pascal; Palin, Cyril; Lecomte, Claude; Schaniel, Dominik |
| Journal of publication | Acta crystallographica Section B, Structural science, crystal engineering and materials |
| Year of publication | 2014 |
| Journal volume | 70 |
| Journal issue | Pt 5 |
| Pages of publication | 783 - 791 |
| a | 6.14102 ± 0.00007 Å |
| b | 11.8451 ± 0.00016 Å |
| c | 15.5509 ± 0.0003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1131.19 ± 0.03 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 58 |
| Hermann-Mauguin space group symbol | P n n m |
| Hall space group symbol | -P 2 2n |
| Residual factor for all reflections | 0.0456 |
| Residual factor for significantly intense reflections | 0.0245 |
| Weighted residual factors for significantly intense reflections | 0.056 |
| Weighted residual factors for all reflections included in the refinement | 0.0624 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.901 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 246073 (current) | 2019-12-26 | cif/ Adding structures of 2311663 via cif-deposit CGI script. |
2311663.cif |
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Users of the data should acknowledge the original authors of the
structural data.