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Information card for entry 2311701
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Coordinates | 2311701.cif |
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Original IUCr paper | HTML |
Common name | Compound_1 |
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Formula | C20 H12 Cl2 S2 |
Calculated formula | C20 H12 Cl2 S2 |
SMILES | Clc1cccc2cccc(SSc3cccc4cccc(Cl)c34)c12 |
Title of publication | Nature of E<sub>2</sub>X<sub>2</sub> σ(4c-6e) of the X—E-E—X type at naphthalene 1,8-positions and model, elucidated by X-ray crystallographic analysis and QC calculations with the QTAIM approach. |
Authors of publication | Tsubomoto, Yutaka; Hayashi, Satoko; Nakanishi, Waro; Sasamori, Takahiro; Tokitoh, Norihiro |
Journal of publication | Acta crystallographica Section B, Structural science, crystal engineering and materials |
Year of publication | 2017 |
Journal volume | 73 |
Journal issue | Pt 2 |
Pages of publication | 265 - 275 |
a | 7.824 ± 0.002 Å |
b | 28.782 ± 0.008 Å |
c | 14.35 ± 0.004 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3231.5 ± 1.5 Å3 |
Cell temperature | 103 ± 2 K |
Ambient diffraction temperature | 103 ± 2 K |
Number of distinct elements | 4 |
Space group number | 29 |
Hermann-Mauguin space group symbol | P c a 21 |
Hall space group symbol | P 2c -2ac |
Residual factor for all reflections | 0.0203 |
Residual factor for significantly intense reflections | 0.0201 |
Weighted residual factors for significantly intense reflections | 0.052 |
Weighted residual factors for all reflections included in the refinement | 0.0522 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.073 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
---|---|---|---|
246090 (current) | 2019-12-26 | cif/ Adding structures of 2311701, 2311702, 2311703 via cif-deposit CGI script. |
2311701.cif |
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Users of the data should acknowledge the original authors of the
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