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Information card for entry 2311780
Preview
Coordinates | 2311780.cif |
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Original paper (by DOI) | HTML |
Formula | Ba2 Eu2 O13 Si4 |
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Calculated formula | Ba2 Eu2 O13 Si4 |
Title of publication | Crystal chemistry and the role of ionic radius in rare earth tetrasilicates: Ba<sub>2</sub>RE<sub>2</sub>Si<sub>4</sub>O<sub>12</sub>F<sub>2</sub> (RE = Er<sup>3+</sup>-Lu<sup>3+</sup>) and Ba<sub>2</sub>RE<sub>2</sub>Si<sub>4</sub>O<sub>13</sub> (RE = La<sup>3+</sup>-Ho<sup>3+</sup>). |
Authors of publication | Fulle, Kyle; Sanjeewa, Liurukara D.; McMillen, Colin D.; Kolis, Joseph W. |
Journal of publication | Acta crystallographica Section B, Structural science, crystal engineering and materials |
Year of publication | 2017 |
Journal volume | 73 |
Journal issue | Pt 5 |
Pages of publication | 907 - 915 |
a | 12.9545 ± 0.0013 Å |
b | 5.2311 ± 0.0008 Å |
c | 17.595 ± 0.005 Å |
α | 90° |
β | 104.23 ± 0.02° |
γ | 90° |
Cell volume | 1155.8 ± 0.4 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 4 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0485 |
Residual factor for significantly intense reflections | 0.0435 |
Weighted residual factors for significantly intense reflections | 0.1149 |
Weighted residual factors for all reflections included in the refinement | 0.1191 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.111 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
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246104 (current) | 2019-12-26 | cif/ Adding structures of 2311776, 2311777, 2311778, 2311779, 2311780, 2311781, 2311782, 2311783, 2311784, 2311785, 2311786, 2311787 via cif-deposit CGI script. |
2311780.cif |
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Users of the data should acknowledge the original authors of the
structural data.