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Information card for entry 2312498
Preview
| Coordinates | 2312498.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Ge4 N4 O4 Sn |
|---|---|
| Calculated formula | Ge4 N4 O4 Sn |
| Title of publication | Crystal structures of two new high-pressure oxynitrides with composition SnGe<sub>4</sub>N<sub>4</sub>O<sub>4</sub>, from single-crystal electron diffraction. |
| Authors of publication | Gollé-Leidreiter, Philipp; Bhat, Shrikant; Wiehl, Leonore; Wen, Qingbo; Kroll, Peter; Ishikawa, Ryo; Etter, Martin; Farla, Robert; Ikuhara, Yuichi; Riedel, Ralf; Kolb, Ute |
| Journal of publication | Acta crystallographica Section B, Structural science, crystal engineering and materials |
| Year of publication | 2024 |
| Journal volume | 80 |
| Journal issue | 3 |
| a | 5.876 ± 0.003 Å |
| b | 5.876 ± 0.003 Å |
| c | 9.418 ± 0.005 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 281.6 ± 0.3 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 4 |
| Space group number | 186 |
| Hermann-Mauguin space group symbol | P 63 m c |
| Hall space group symbol | P 6c -2c |
| Residual factor for all reflections | 0.1001 |
| Residual factor for significantly intense reflections | 0.0942 |
| Weighted residual factors for significantly intense reflections | 0.1053 |
| Weighted residual factors for all reflections included in the refinement | 0.1064 |
| Goodness-of-fit parameter for significantly intense reflections | 3.5927 |
| Goodness-of-fit parameter for all reflections included in the refinement | 3.3713 |
| Diffraction radiation probe | electron |
| Diffraction radiation wavelength | 0.0197 Å |
| Diffraction radiation type | electron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 291814 (current) | 2024-05-11 | cif/ Adding structures of 2312498, 2312499, 2312500, 2312501 via cif-deposit CGI script. |
2312498.cif |
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Users of the data should acknowledge the original authors of the
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