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Information card for entry 4001962
Preview
Coordinates | 4001962.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C80 H68 Cl12 N2 O8 |
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Calculated formula | C74.2 H56 N2 O8 |
SMILES | COc1ccc(cc1)c1c2c(c(c3c1C(=O)N(C3=O)CCCCCCCCCCCCN1C(=O)c3c(C1=O)c(c1ccc(cc1)OC)c1c(c3c3ccc(cc3)OC)c3cccc4c3c1ccc4)c1ccc(cc1)OC)c1c3c2cccc3ccc1 |
Title of publication | Alkylene-Chain Effect on Microwire Growth and Crystal Packing of π-Moieties |
Authors of publication | Ding, Lin; Li, Hai-Bin; Lei, Ting; Ying, Han-Ze; Wang, Rui-Bo; Zhou, Yan; Su, Zhong-Min; Pei, Jian |
Journal of publication | Chemistry of Materials |
Year of publication | 2012 |
Journal volume | 24 |
Journal issue | 10 |
Pages of publication | 1944 |
a | 9.756 ± 0.002 Å |
b | 13.361 ± 0.003 Å |
c | 15.794 ± 0.003 Å |
α | 104.18 ± 0.03° |
β | 103.41 ± 0.03° |
γ | 100.78 ± 0.03° |
Cell volume | 1875.6 ± 0.9 Å3 |
Cell temperature | 113 ± 2 K |
Ambient diffraction temperature | 113 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.4862 |
Residual factor for significantly intense reflections | 0.4538 |
Weighted residual factors for significantly intense reflections | 0.7954 |
Weighted residual factors for all reflections included in the refinement | 0.8236 |
Goodness-of-fit parameter for all reflections included in the refinement | 3.588 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
---|---|---|---|
178377 (current) | 2016-03-21 | cif/4/ (antanas@kurmis) Replacing _[local]_cod_* tags with their equivalents from the COD CIF dictionary in multiple entries in subrange 4/00. |
4001962.cif |
113582 | 2014-05-13 | cif/ Adding structures of 4001962 via cif-deposit CGI script. |
4001962.cif |
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Users of the data should acknowledge the original authors of the
structural data.