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Information card for entry 4003060
Preview
| Coordinates | 4003060.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H33 B F4 N O6 S |
|---|---|
| Calculated formula | C24 H33 B F4 N O6 S |
| SMILES | S1c2c(N(c3c1cc(OCCOCCOC)cc3)CC)ccc(OCCOCCOC)c2.[B](F)(F)(F)[F-] |
| Title of publication | Tailoring Two-Electron-Donating Phenothiazines To Enable High-Concentration Redox Electrolytes for Use in Nonaqueous Redox Flow Batteries |
| Authors of publication | Attanayake, N. Harsha; Kowalski, Jeffrey A.; Greco, Katharine V.; Casselman, Matthew D.; Milshtein, Jarrod D.; Chapman, Steven J.; Parkin, Sean R.; Brushett, Fikile R.; Odom, Susan A. |
| Journal of publication | Chemistry of Materials |
| Year of publication | 2019 |
| Journal volume | 31 |
| Journal issue | 12 |
| Pages of publication | 4353 |
| a | 15.3654 ± 0.0011 Å |
| b | 8.2286 ± 0.0006 Å |
| c | 19.8784 ± 0.0016 Å |
| α | 90° |
| β | 98.196 ± 0.003° |
| γ | 90° |
| Cell volume | 2487.7 ± 0.3 Å3 |
| Cell temperature | 90 ± 0.2 K |
| Ambient diffraction temperature | 90 ± 0.2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0365 |
| Residual factor for significantly intense reflections | 0.0332 |
| Weighted residual factors for significantly intense reflections | 0.0853 |
| Weighted residual factors for all reflections included in the refinement | 0.0877 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.034 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 220479 (current) | 2019-10-29 | cif/ Adding structures of 4003060 via cif-deposit CGI script. |
4003060.cif |
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Users of the data should acknowledge the original authors of the
structural data.