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Information card for entry 4003189
Preview
| Coordinates | 4003189.cif | 
|---|---|
| Original paper (by DOI) | HTML | 
| Formula | C15 H36 Au N3 Si2 | 
|---|---|
| Calculated formula | C15 H36 Au N3 Si2 | 
| SMILES | [Au](=C1N(CCN1C(C)C)C(C)C)N([Si](C)(C)C)[Si](C)(C)C | 
| Title of publication | Surfactant Directed Growth of Gold Metal Nanoplates by Chemical Vapor Deposition | 
| Authors of publication | Griffiths, Matthew B. E.; Koponen, Sara E.; Mandia, David J.; McLeod, Jennifer F.; Coyle, Jason P.; Sims, Jeffrey J.; Giorgi, Javier B.; Sirianni, Eric R.; Yap, Glenn P. A.; Barry, Seán T. | 
| Journal of publication | Chemistry of Materials | 
| Year of publication | 2015 | 
| Journal volume | 27 | 
| Journal issue | 17 | 
| Pages of publication | 6116 | 
| a | 19.855 ± 0.007 Å | 
| b | 12.366 ± 0.004 Å | 
| c | 10.331 ± 0.003 Å | 
| α | 90° | 
| β | 119.994 ± 0.008° | 
| γ | 90° | 
| Cell volume | 2196.8 ± 1.2 Å3 | 
| Cell temperature | 200 ± 2 K | 
| Ambient diffraction temperature | 200 ± 2 K | 
| Number of distinct elements | 5 | 
| Space group number | 15 | 
| Hermann-Mauguin space group symbol | C 1 2/c 1 | 
| Hall space group symbol | -C 2yc | 
| Residual factor for all reflections | 0.0148 | 
| Residual factor for significantly intense reflections | 0.0142 | 
| Weighted residual factors for significantly intense reflections | 0.0363 | 
| Weighted residual factors for all reflections included in the refinement | 0.0366 | 
| Goodness-of-fit parameter for all reflections included in the refinement | 1.082 | 
| Diffraction radiation wavelength | 0.71073 Å | 
| Diffraction radiation type | MoKα | 
| Has coordinates | Yes | 
| Has disorder | No | 
| Has Fobs | No | 
| Revision | Date | Message | Files | 
|---|---|---|---|
| 231422 (current) | 2019-11-22 | cif/ Adding structures of 4003189 via cif-deposit CGI script. | 4003189.cif | 
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          Users of the data should acknowledge the original authors of the
          structural data.