Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4003207
Preview
| Coordinates | 4003207.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H34 N6 S2 Sn2 |
|---|---|
| Calculated formula | C22 H34 N6 S2 Sn2 |
| SMILES | CN(C)C1=[N](c2ccccc2)[Sn]2([N](C)(C)[Sn]3([N]2(C)C)[N](=C(N(C)C)S3)c2ccccc2)S1 |
| Title of publication | Polymorph-Selective Deposition of High Purity SnS Thin Films from a Single Source Precursor |
| Authors of publication | Ahmet, Ibbi Y.; Hill, Michael S.; Johnson, Andrew L.; Peter, Laurence M. |
| Journal of publication | Chemistry of Materials |
| Year of publication | 2015 |
| Journal volume | 27 |
| Journal issue | 22 |
| Pages of publication | 7680 |
| a | 6.1351 ± 0.0001 Å |
| b | 8.9483 ± 0.0002 Å |
| c | 12.4437 ± 0.0003 Å |
| α | 93.009 ± 0.001° |
| β | 99.232 ± 0.001° |
| γ | 94.8946 ± 0.0016° |
| Cell volume | 670.31 ± 0.02 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0467 |
| Residual factor for significantly intense reflections | 0.0437 |
| Weighted residual factors for significantly intense reflections | 0.1103 |
| Weighted residual factors for all reflections included in the refinement | 0.1118 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.174 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 231428 (current) | 2019-11-22 | cif/ Adding structures of 4003207 via cif-deposit CGI script. |
4003207.cif |
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.