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Information card for entry 4003323
Preview
| Coordinates | 4003323.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C54 H55 Cl Cu N2 O3 P |
|---|---|
| Calculated formula | C54 H55 Cl Cu N2 O3 P |
| SMILES | c1cc(c2ccc3c(cc[n]4c3c2[n]1[Cu]4(Cl)[P](c1ccccc1)(c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1.C1CCCO1.C1CCCO1.C1CCCO1 |
| Title of publication | Ligand-Exchange-Induced Growth of an Atomically Precise Cu29 Nanocluster from a Smaller Cluster |
| Authors of publication | Nguyen, Thuy-Ai D.; Jones, Zachary R.; Leto, Domenick F.; Wu, Guang; Scott, Susannah L.; Hayton, Trevor W. |
| Journal of publication | Chemistry of Materials |
| Year of publication | 2016 |
| Journal volume | 28 |
| Journal issue | 22 |
| Pages of publication | 8385 |
| a | 11.622 ± 0.0006 Å |
| b | 16.3129 ± 0.001 Å |
| c | 24.6222 ± 0.0011 Å |
| α | 90° |
| β | 96.269 ± 0.003° |
| γ | 90° |
| Cell volume | 4640.2 ± 0.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1438 |
| Residual factor for significantly intense reflections | 0.0738 |
| Weighted residual factors for significantly intense reflections | 0.1728 |
| Weighted residual factors for all reflections included in the refinement | 0.2075 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.021 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 231516 (current) | 2019-11-22 | cif/ Adding structures of 4003322, 4003323 via cif-deposit CGI script. |
4003323.cif |
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Users of the data should acknowledge the original authors of the
structural data.