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Information card for entry 4003399
Preview
Coordinates | 4003399.cif |
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Original paper (by DOI) | HTML |
Formula | C23 H21 N3 O2 S4 |
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Calculated formula | C23 N3 O2 S4 |
SMILES | s1c(nc2c1c1sc(nc1C(=O)N(CCCCCCC)C2=O)c1sccc1)c1sccc1 |
Title of publication | Imide-Functionalized Thiazole-Based Polymer Semiconductors: Synthesis, Structure‒Property Correlations, Charge Carrier Polarity, and Thin-Film Transistor Performance |
Authors of publication | Shi, Yongqiang; Guo, Han; Qin, Minchao; Wang, Yuxi; Zhao, Jiuyang; Sun, Huiliang; Wang, Hang; Wang, Yulun; Zhou, Xin; Facchetti, Antonio; Lu, Xinhui; Zhou, Ming; Guo, Xugang |
Journal of publication | Chemistry of Materials |
Year of publication | 2018 |
Journal volume | 30 |
Journal issue | 21 |
Pages of publication | 7988 |
a | 46.45 ± 0.006 Å |
b | 46.45 ± 0.006 Å |
c | 7.164 ± 0.0014 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 13386 ± 4 Å3 |
Cell temperature | 566 ± 2 K |
Ambient diffraction temperature | 566 ± 2 K |
Number of distinct elements | 5 |
Space group number | 148 |
Hermann-Mauguin space group symbol | R -3 :H |
Hall space group symbol | -R 3 |
Residual factor for all reflections | 0.1331 |
Residual factor for significantly intense reflections | 0.1121 |
Weighted residual factors for significantly intense reflections | 0.297 |
Weighted residual factors for all reflections included in the refinement | 0.3136 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.655 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
---|---|---|---|
256620 (current) | 2020-09-22 | cif/4 Fixing some Z values and formulae |
4003399.cif |
231573 | 2019-11-22 | cif/ Adding structures of 4003399 via cif-deposit CGI script. |
4003399.cif |
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Users of the data should acknowledge the original authors of the
structural data.