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Information card for entry 4087410
Preview
| Coordinates | 4087410.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H45 B Co N2 P2 |
|---|---|
| Calculated formula | C22 H45 B Co N2 P2 |
| SMILES | [Co]123([P](Nc4c2c(N[P]1(C(C)(C)C)C(C)(C)C)ccc4)(C(C)(C)C)C(C)(C)C)[H][BH2][H]3 |
| Title of publication | Synthesis, Structure, and Reactivity of Co(II) and Ni(II) PCP Pincer Borohydride Complexes. |
| Authors of publication | Murugesan, Sathiyamoorthy; Stöger, Berthold; Weil, Matthias; Veiros, Luis F.; Kirchner, Karl |
| Journal of publication | Organometallics |
| Year of publication | 2015 |
| Journal volume | 34 |
| Journal issue | 7 |
| Pages of publication | 1364 - 1372 |
| a | 22.7682 ± 0.0005 Å |
| b | 8.0685 ± 0.0008 Å |
| c | 13.9631 ± 0.0015 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2565.1 ± 0.4 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 6 |
| Space group number | 33 |
| Hermann-Mauguin space group symbol | P n a 21 |
| Hall space group symbol | P 2c -2n |
| Residual factor for all reflections | 0.0438 |
| Residual factor for significantly intense reflections | 0.0342 |
| Weighted residual factors for significantly intense reflections | 0.0425 |
| Weighted residual factors for all reflections included in the refinement | 0.0443 |
| Goodness-of-fit parameter for significantly intense reflections | 1.24 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.19 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 236785 (current) | 2019-11-24 | cif/ Adding structures of 4087408, 4087409, 4087410, 4087411, 4087412, 4087413 via cif-deposit CGI script. |
4087410.cif |
All data in the COD and the database itself are dedicated to the
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Users of the data should acknowledge the original authors of the
structural data.